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Atomic Force Microscopy (AFM)

The WITec Atomic Force Microscope (AFM) module integrated with a research-grade optical microscope provides superior optical access, easy cantilever tip alignment, and high-resolution sample survey. The WITec AFM objective provides a direct view of both sample and cantilever for straightforward and precise AFM tip positioning. All WITec Atomic Force Microscopes are designed to combine other imaging techniques such as Raman spectroscopy, Scanning Near-field Optical microscopy (SNOM), and luminescence microscopy polarization analysis, and light-field/dark-field illumination. The user can change between imaging methods by simply rotating the (optionally motorized) objective turret.

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Applications Atomic Force Microscopy
Industries Aerospace, Civil Infrastructure, Commercial Services, Defence & Security, Education & Research, Manufacturing, Mining, Oil & Gas, Power Generation, Utilities - Electricity and Water
  • Surface characterization on the nanometer scale
  • Non-destructive imaging
  • Optical and Atomic Force Microscope combination
  • Convenient sample access from any direction
  • Minimal, if any, sample preparation
  • Ease of use in air and liquids
  • Combinable with confocal Raman imaging and Scanning Near-field Optical Microscopy (SNOM)
  • TrueScan™ controlled piezo-driven scanning stages with capacitive feedback loops (30x30x10μm3  and  100x100x20μm3 ).

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Product Brochures

  1. WITec-AFM-Brochure.pdf