• Platinum Silicide AFM Probes

Platinum Silicide AFM Probes

Manufacturer: NANOSENSORS
NANOSENSORS PtSi-CONT are designed for contact mode (repulsive mode) AFM imaging. Furthermore this probe can be used for force-distance spectroscopy or pulsed force mode (PFM) The CONT type is optimized for high sensitivity due a low force constant. For applications that require a wear resistant and electrically conductive tip we recommend this type. NANOSENSORS PtSi-CONT are suitable for C-AFM, Tunneling AFM (TUNA) and Scanning Capacitance Microscopy (SCM).

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  • Platinum silicide coating with excellent conductivity and good wear-out behaviour
  • Chemically inert
  • High mechanical Q-factor for high sensitivity
  • Alignment grooves on rear of the holder chip