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  • Ultra High Frequency AFM Probes for High-Speed AFM

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Ultra High Frequency AFM Probes for High-Speed AFM

Ultra High Frequency AFM Probes for High-Speed AFM

NanoWorld Ultra-Short Cantilevers (USC) for High-Speed AFM (HS-AFM) combine very small cantilevers capable of resonating in the MHz regime and a very sharp and wear resistant tip.
 
The cantilever of the USC series is rectangular and made of a quartz-like material. A gold layer is deposited on both sides of the cantilever in order to enhance the reflectance of the laser beam, but the tip remains uncoated.

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  • The silicon support chip is of standard dimensions (1.6 mm x 3.4 mm x 0.3 mm)
  • It has etched and lowered corners in order to avoid contact between the support chip and the sample when scanning
  • Alignment grooves on the back side of the silicon support chip which ensure replacement of the probes without major adjustment of the laser beam when used in conjunction with the alignment chip

 

 

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